A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
Caterina Bassi, former PhD student at MOX, along with other group members published a MOX report containing the results of the first […]
Based on the numerical tools developed in past projects carried on in collaboration with MOXOFF in the framework of a long lasting collaboration with Tetra […]
A new article on free-surface problems with moving contact line by Ivan Fumagalli, Nicola Parolini and Marco Verani has appeared on Journal of […]
MOX is participating in the ESCAPE-2 FET H2020 project for the development of exascale demonstrators for numerical weather prediction. The tasks involve the development […]
