A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
A research project on the simulation of drill-string inside well bore has been defined with Tenaris, the world leader supplier of tubes […]
The SUSTAIN project has been selected for funding within the FISA2024 call. The SUSTAIN (SUbstrate and Systems of Trays for Agricultural INnovation) […]
A new MOX report entitled “A new fluid-based strategy for the connection of non-matching lattice materials” by Nicola Ferro, Simona Perotto […]
MOX is participating in the ESCAPE-2 FET H2020 project for the development of exascale demonstrators for numerical weather prediction. The tasks involve the development […]
