A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
A new paper by Ivan Fumagalli, Nicola Parolini and Marco Verani on the optimal control of ink-jet printing process has been […]
On Thursday February 10, 2022 Prof. Ron Kenett, Chairman of the KPA Group, Senior Research Fellow, the Samuel Neaman Institute, Technion, Haifa […]
A paper on a p-adaptive approach to LES modelling of compressible flows with DG methods has been published by Antonella Abbà, Luca […]
A new MOX report entitled “Multi-physics inverse homogenization for the design of innovative cellular materials: application to thermo-mechanical problems” by Matteo Gavazzoni, […]
