A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
On Tuesday 14 February at 2:15 PM in Aula Saleri (VI floor, La Nave Building), Dario Andrini, new MOX postdoc researcher, will […]
A new MOX report entitled “An efficient and accurate implicit DG solver for the incompressible Navier-Stokes equations” by Giuseppe Orlando, Alessandro Della […]
A new MOX report entitled “Reduced order modeling of nonlinear microstructures through Proper Orthogonal Decomposition” by Giorgio Gobat, Andrea Opreni, Stefania Fresca, […]
A workshop devoted to Fault tolerant algorithms and resiliency approaches for exascale computing was organized by SC4I at MOX on January 23-24 2019 in […]
