A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
A new MOX report proving the convergence of cell centered finite volume discretisations used in the OpenFOAM software for the Laplace operator […]
A new article on free-surface problems with moving contact line by Ivan Fumagalli, Nicola Parolini and Marco Verani has appeared on Journal of […]
A new project in collaboration with MOXOFF and Tetra Pak has analysed the potential application of reduced order modeling for the design of components […]
A new MOX report entitled “A new fluid-based strategy for the connection of non-matching lattice materials” by Nicola Ferro, Simona Perotto […]
